Solo autori OAB
La lista e` ordinata per I.F. in senso decrescente.
Documenti in archivio:
1
- Autore: Negri, R
1/1 pag.
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Totals
- ∑Authors OAB/Tot.: 2 / 4
- Percentage OAB_Authors: 50%
- ∑citations: 0
- ∑I.F.: 0
- ∑ I.F. / n. publications: 0
7. TECHNICAL REPORTS
Reflectivity and stress characterization of W/Si and Pt/C
multilayer samples for the New Hard X-ray Mission phase B
development
Spiga, D. , Raimondi, L., Salmaso, B. , Negri, R.
2010, INAF/OAB internal report 03/2010